Vital to quality control, North American Imaging Industrial's non-destructive testing (NDT) inspection software combined with our digital cameras or flat panel detectors allow manufacturers to find contamination, scratches, cracks, blemishes, gaps, pits and other production flaws. Post-processing software can detect defects invisible to the human eye – faster and more accurately.

We offer several user-friendly software packages to meet a variety of applications for a wide range of industries. Choose from one of our three software packages or let us put together a customized package to fit your unique needs. Download the NAI Industrial Software Sheet or contact us today to learn more.


Software 1 Software 2 Software 3

Standard Software Package

  • Image capturing and saving (.jpg, .bmp, .tif)
  • Auto Live image averaging
  • Post capture image enhancements
    • Brightness and contrast adjustments
    • Image filters (sharpen, psuedo color, negative)
  • Point to point distance measurement tool
  • Measurement calibration (inches, mm, mils)
  • Image annotation tool:
    • On screen text tool
    • Arrow drawing
    • Line, circular or rectangular shape drawing
  • Quad view imaging tool (allows user to capture four images and combine them into one picture)

Advanced Software Package

  • All the features of the Optimum Software Pacakge
  • Full line of measurement tools :
    • QFN measurement algorithm tools
      • Joint area
      • Percent void
      • Pass/fail criteria
    • Semiconductor measurement algorithm tools
      • Bond wire sweep
      • Die attach void measurement
      • Pass/fail criteria
    • Gull wing joint measurement algorithm tools
      • Joint area
      • Percent void
      • Pass/fail criteria
    • Drill offset measurement
      • Center to center offset (X & Y distance)

Optimum Software Package

  • All the features of the Standard Software Package
  • BGA measurement algorithm tools
  • Solder ball size:
    • Ball area
    • Ball diameter
    • Ball roundness
    • Percent void
    • Pass fail criteria
    • Image reporting